Número de Documento     
Artículo:

Embedded test offers unique value for serial I/O

Autor:

Bill Schulze

Resumen:

Although incorporating high-speed serial buses into embedded systems solves many problems, the design and validation processes differ and aren't well understood.

Página:

30

Publicación:

Embedded Systems Design

Volúmen:

20

Número:

8

Periodo:

Agosto 2007

ISSN:

15582493

SrcID:

15582493-2007-08.txt

Número de Documento